Cart (Loading....) | Create Account
Close category search window
 

A Robust Algorithm for Eye-Diagram Analysis

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Jargon, J.A. ; Optoelectron. Div., Nat. Inst. of Stand. & Technol., Boulder, CO ; Wang, C.M. ; Hale, P.D.

We present a new method for analyzing eye diagrams that always provides a unique solution by making use of a robust, least-median-of-squares (LMS) location estimator. In contrast to commonly used histogram techniques, the LMS procedure is insensitive to outliers and data distributions. Our motivation for developing this algorithm is to create an independent, benchmark method that is both amenable to a thorough uncertainty analysis and can function as a comparison tool since no standardized industry algorithms currently exist. Utilizing this technique, we calculate the fundamental parameters of an eye diagram, namely the one and zero levels, and the time and amplitude crossings. With these parameters determined, we can derive various performance metrics, such as extinction ratio and root-mean-square jitter, and perform eye-mask alignment. In addition to describing our algorithm in detail, we compare results computed with this method to those of a commercial oscilloscope, and obtain excellent agreement. Finally, we suggest new definitions of eye height and eye width that are more robust than those that are commonly used.

Published in:

Lightwave Technology, Journal of  (Volume:26 ,  Issue: 21 )

Date of Publication:

Nov.1, 2008

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.