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Thermal stability of bias point of packaged linear modulators in lithium niobate

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4 Author(s)
A. S. Greenblatt ; Naval Res. Lab., Washington, DC, USA ; C. H. Bulmer ; R. P. Moeller ; W. K. Burns

The thermal stability of the bias point of packaged, passively biased, X-cut LiNbO3 interferometric modulators is described. Absolute stability is assessed and a comparison is made of stability before and after laser ablation adjustment used to tune the bias point to linear operation (90° phase angle). Ablation is shown to be successful in setting the bias angle to ±1° of the desired value. The angle remained stable to a total variation of <5° over -25-+42°C both before and after ablation. All the observed angular changes with temperature were in the range 0.02-0.09 deg/°C. The effect of humidity in the package on modulator stability is characterized and then minimized for the actual devices

Published in:

Journal of Lightwave Technology  (Volume:13 ,  Issue: 12 )