By Topic

Towards Successive Privacy Protection in Sensor Networks

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

7 Author(s)
Baokang Zhao ; Sch. of Comput. Sci., Nat. Univ. of Defense Technol., Changsha ; Dan Wang ; Zili Shao ; Jiannong Cao
more authors

With the emerging embedding of the sensor networks into the pervasive environment, our capabilities on location information gathering and processing have been greatly improved. Although this information is very useful, it also brings great challenges for protecting the privacy. Currently, most research efforts focus on protecting current location, and ignore the internal relationship among the successive locations information. To date, there are many techniques to infer a location when the related successive information is published, and which brings in serious privacy and security concerns. In this paper, we for the first time consider this kind of relationship, and identify a novel successive privacy threat. We then formulate a generic model for protecting the successive privacy. Under this model, there is a trade-off between the number of data to be published and the privacy protecting level, and which brings a novel maximum publishable location privacy problem. As this problem is intractable, we develop several heuristics. Extensive simulations demonstrate the effectiveness of our schemes.

Published in:

Embedded and Ubiquitous Computing, 2008. EUC '08. IEEE/IFIP International Conference on  (Volume:2 )

Date of Conference:

17-20 Dec. 2008