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Defect Identification in Large Area Electronic Backplanes

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8 Author(s)
Sanjiv Sambandan ; Palo Alto Res. Center, Electron. Mater. & Device Lab., Palo Alto, CA ; Raj B. Apte ; William S. Wong ; Rene Lujan
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We describe a rapid testing system for active matrix thin-film transistor (TFT) backplanes which enables the identification of many common processing defects. The technique spatially maps the charge feedthrough from TFTs in the pixel and is suited for pixels with switched-capacitor architecture.

Published in:

Journal of Display Technology  (Volume:5 ,  Issue: 1 )