By Topic

An ROBDD-Based Combinatorial Method for the Evaluation of Yield of Defect-Tolerant Systems-on-Chip

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Carrasco, J.A. ; Univ. Politec. de Catalunya, Barcelona ; Sune, V.

In this paper, we develop a combinatorial method for the evaluation of the functional yield of defect-tolerant systems-on-chip (SoC). The method assumes that random manufacturing defects are produced according to a model in which defects cause the failure of given components of the system following a distribution common to all defects. The distribution of the number of defects is arbitrary. The yield is obtained by conditioning on the number of defects that result in the failure of some component and performing recursive computations over a reduced ordered binary decision diagram (ROBDD) representation of the fault-tree function of the system. The method has excellent error control. Numerical experiments seem to indicate that the method is efficient and, with some exceptions, allows the analysis with affordable computational resources of systems with very large numbers of components.

Published in:

Very Large Scale Integration (VLSI) Systems, IEEE Transactions on  (Volume:17 ,  Issue: 2 )