Cart (Loading....) | Create Account
Close category search window

Line-Frequency Instability of PFC Power Supplies

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Chu, G. ; Dept. of Electron. & Inf. Engneering, Hong Kong Polytech. Univ., Hong Kong ; Tse, C.K. ; Siu Chung Wong

Typically, a power-factor-correction (PFC) power supply consists of two stages, one responsible for PFC and the other for voltage regulation. In this paper, we propose to use a constant power sink to represent the voltage regulating stage, resulting in an analytically tractable model that is able to predict the period-doubled oscillations at line frequency that are not detectable by other conventional models. Using a generalized averaging approach, we investigate the low-frequency dynamics and derive closed-form stability conditions that accurately locate the stability boundaries on selected parameter planes. The model can be conveniently used to evaluate the performance of PFC power supplies, such as harmonic distortion and power factor. Experimental results are presented to verify the model.

Published in:

Power Electronics, IEEE Transactions on  (Volume:24 ,  Issue: 2 )

Date of Publication:

Feb. 2009

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.