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Characterisation of organic field effect transistor structures by micro-Raman spectroscopy, AFM and XRD methods

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7 Author(s)
Rudolf Smanek ; Dept. of Microelectronics, Slovak Univ. of Technol., Ilkovicova 3, Bratislava, Slovakia. e-mail: rudolf.srnanek@stuba.sk ; Jaroslav Kovac ; Jan Jakabovic ; Jaroslav Kovac
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Three independent methods show clear evidence that pentacene layers grown on parylene C layer had better molecular microstructure compared to films grown on SiO2 surface. The electrical measurements confirmed these results and carrier mobility of 0.15 cm2 /Vs was obtained in OFET devices.

Published in:

Advanced Semiconductor Devices and Microsystems, 2008. ASDAM 2008. International Conference on

Date of Conference:

12-16 Oct. 2008