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An application of the ideal structure extraction method (ISEM) for modeling emissions

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2 Author(s)
Hardin, K.B. ; Lexmark Int., Inc., Lexington, KY, USA ; Fessler, J.T.

An application of the structure removal ideal structure extraction method (ISEM) recently developed by K. B. Hardin and C. R. Paul is presented. This ISEM is applied to a complex printed circuit board (PCB) with attached input/output cable. The structure removal ISEM decomposes this complex structure (total mode model or TMM) into two components, an ideal structure (symmetric mode model or SMM) and a residual structure (asymmetric mode model or AMM). Each component can be individually analyzed or measured by different methods. By superposition, the electromagnetic fields of the TMM are equal to the sum of the individual fields of the SMM and AMM. Using this method, the electric fields of the TMM are computed, and the results are compared to measured data, with good agreement

Published in:

Electromagnetic Compatibility, 1993. Symposium Record., 1993 IEEE International Symposium on

Date of Conference:

9-13 Aug 1993