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A Fully Performance Compatible 45 nm 4-Gigabit Three Dimensional Double-Stacked Multi-Level NAND Flash Memory With Shared Bit-Line Structure

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12 Author(s)
Park, Ki-Tae ; Semicond. R&D Center, Samsung Electron. Co., Ltd., Hwasung ; Myounggon Kang ; Hwang, Soonwook ; Doogon Kim
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A 3-dimensional double stacked 4 gigabit multilevel cell NAND flash memory device with shared bitline structure have successfully developed. The device is fabricated by 45 nm floating-gate CMOS and single-crystal Si layer stacking technologies. To support fully compatible device performance and characteristics with conventional planar device, shared bitline architecture including Si layer-dedicated decoder and Si layer-compensated control schemes are also developed. By using the architecture and the design techniques, a memory cell size of 0.0021 mum2/bit per unit feature area which is smallest cell size and 2.5 MB/s program throughput with 2 kB page size which is almost equivalent performance compared to conventional planar device are realized.

Published in:

Solid-State Circuits, IEEE Journal of  (Volume:44 ,  Issue: 1 )

Date of Publication:

Jan. 2009

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