Cart (Loading....) | Create Account
Close category search window
 

Measurements of dielectric stress in EHV power transformer insulation

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Vailles, C. ; ABB-Varennes, Quebec, Que., Canada ; Malewski, Ryszard ; Xuan Dai-Do ; Aubin, J.

A relatively high failure rate of the internal insulation of EHV power transformers has been reported by public utilities. This prompted a study of the safety margin of EHV transformers in service and under test. In this project, a number of transient overvoltages were digitally recorded in EHV substations and the transient voltage distribution along the HV winding was measured digitally on many untanked transformers. An evaluation of the safety margin indicates that test impulse waveforms specified in the standards do not always represent system-generated transients, which can jeopardize EHV transformer insulation. The insulation can be designed in such a way to keep a similar safety margin in different parts of the winding, and insulating materials can be used more efficiently

Published in:

Power Delivery, IEEE Transactions on  (Volume:10 ,  Issue: 4 )

Date of Publication:

Oct 1995

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.