Cart (Loading....) | Create Account
Close category search window

A Simple and Efficient Edge Detection Algorithm

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Guangyu Luan ; Dept. of Autom. Meas. & Control, Harbin Inst. of Technol., Harbin, China ; Rensheng Che

A simple and efficient edge detection algorithm based on wavelet transform and morphology is proposed. Combined with dyadic wavelet transform and image gradient calculation, the smoothing filter operators are introduced. Then to the non-uniform illumination problem, a local thresholding, which determines the edges, can be constructed by the algorithm of maximization of between-class variance (Otsu¿s method) and morphological opening. Through the synthetic image experiment, the proposed scheme has the better performance than Mallat¿s and Canny¿s algorithms. Experiments on Lena and Peppers benchmark images show that it not only detects the image edge correctly but also has the good suppressing noise ability. Further it is effective to the Bank image darkened gradually.

Published in:

Computer Science and Computational Technology, 2008. ISCSCT '08. International Symposium on  (Volume:2 )

Date of Conference:

20-22 Dec. 2008

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.