Cart (Loading....) | Create Account
Close category search window
 

Design Space Exploration for a Custom VLIW Architecture: Direct Photo Printer Hardware Setting Using VEX Compiler

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Saptono, D. ; LE2I - CNRS 5158 Lab., Univ. of Burgundy, Dijon, France ; Brost, V. ; Fan Yang ; Prasetyo, E.

Increasingly more computing power is demanded for contemporary applications such as multimedia, 3D visualization, and telecommunication. This paper presents a design space exploration (DSE) experience for an embedded VLIW processor that allows finding out the best architecture for given application. The proposed method has been implemented and tested using an image processing chain for direct photo printer. Our results show a considerable improvement in hardware cost and performance. After the best architecture is identified, we applied a technique to optimize the code in VEX system that uses ¿inlining¿ function in order to reduce execution time.

Published in:

Signal Image Technology and Internet Based Systems, 2008. SITIS '08. IEEE International Conference on

Date of Conference:

Nov. 30 2008-Dec. 3 2008

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.