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Techniques for accelerated measurement of low bit error rates in computer data links

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4 Author(s)
Palacharla, P. ; Inst. for Inf. Technol., Nat. Res. Council of Canada, Ottawa, Ont., Canada ; Chrostowski, J. ; Neumann, R. ; Gallenberger, R.J.

We present techniques for the rapid estimation of very low (10-12 to 10-20) bit-error-rate (BER) in electrical and optical digital data links. Approximately 2 minutes elapsed time is required to perform a low BER test, independent of the actual BER value being measured. There are two types of applications: (1) confirming very low BER (<10-12) performance, and (2) reducing the time required to measure normal (10-9 to 10-12) BER values. These techniques are valid in the presence of BER floors

Published in:

Computers and Communications, 1995., Conference Proceedings of the 1995 IEEE Fourteenth Annual International Phoenix Conference on

Date of Conference:

28-31 Mar 1995