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Alpha-Particle, Carbon-Ion and Proton- Induced Flip-Flop Single-Event-Upsets in 65 nm Bulk Technology

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5 Author(s)
Wissel, L. ; IBM Syst. & Technol. Group, Essex Junction, VT ; Cannon, E.H. ; Heidel, D.F. ; Gordon, M.S.
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This paper presents upset rates of flip-flops in 65 nm commercial bulk technology predicted through modeling, and compares the predictions to upset rates measured with thorium foil, 15 MeV carbon ions, and 148 MeV protons. This paper demonstrates that 15 MeV carbon ions can be used to emulate the daughter products of neutron spallation reactions.

Published in:

Nuclear Science, IEEE Transactions on  (Volume:55 ,  Issue: 6 )

Date of Publication:

Dec. 2008

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