Referenced Items are not available for this document.
Single event effects in SRAM-based FPGAs have been widely studied and there is a variety of mitigation techniques that can be used in order to achieve a complete fault tolerance. In this scenario, multiple faults are becoming a concern and new methodologies have to be developed in order to evaluate the effects of fault accumulation. In this paper a new Monte Carlo based methodology is used to evaluate soft errors accumulation in the configuration memory of triple modular redundancy designs implemented in SRAM-based FPGAs. Analytical predictions are confirmed by means of fault injection experiments.
Published in:
Nuclear Science, IEEE Transactions on
(Volume:55
,
Issue:
6
)
Date of Publication: Dec. 2008
- Page(s):
- 3381 - 3387
- ISSN :
- 0018-9499
- INSPEC Accession Number:
- 10467214
- Digital Object Identifier :
- 10.1109/TNS.2008.2006839
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 19 January 2009
- Issue Date :
- Dec. 2008
- Sponsored by :
- IEEE Nuclear and Plasma Sciences Society
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