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Single-Event Transient Pulse Propagation in Digital CMOS

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2 Author(s)
Massengill, L.W. ; Vanderbilt Univ., Nashville, TN ; Tuinenga, P.W.

Dynamic circuit equations are used to analyze the response of CMOS inverter chains to stimuli of various forms. Using a normalized description of the CMOS inverter, the conditions under which a single-event transient pulse will propagate are derived in terms of basic technology and circuit parameters. The inverter characteristic waveform, derived in a technology-independent way, is shown to be key to unattenuated pulse propagation. The pulse broadening mechanism is shown to be predictable from CMOS device hysteretic effects, and technology-normalized values of pulse broadening are quantified.

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Nuclear Science, IEEE Transactions on  (Volume:55 ,  Issue: 6 )