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Waveforms of digital single-event transients, radiation-induced voltage transients in logic gates, can be observed by connecting two transistors to a target logic gate. Additional transistors monitor voltage transients through their drain currents, which can be measured using the conventional 50-Omega transmission-line technique widely used for measuring transient currents in single elementary transistors. Experimental results obtained in pulsed-laser irradiation tests demonstrate the validity of the observation technique and clearly reveal the pulse evolution as a function of the laser pulse energy.
Date of Publication: Dec. 2008