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Waveform Observation of Digital Single-Event Transients Employing Monitoring >Transistor Technique

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11 Author(s)
Kobayashi, D. ; Inst. of Space & As- tronautical Sci., Japan Aerosp. Exploration Agency, Sagamihara ; Hirose, K. ; Yanagawa, Y. ; Ikeda, H.
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Waveforms of digital single-event transients, radiation-induced voltage transients in logic gates, can be observed by connecting two transistors to a target logic gate. Additional transistors monitor voltage transients through their drain currents, which can be measured using the conventional 50-Omega transmission-line technique widely used for measuring transient currents in single elementary transistors. Experimental results obtained in pulsed-laser irradiation tests demonstrate the validity of the observation technique and clearly reveal the pulse evolution as a function of the laser pulse energy.

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Nuclear Science, IEEE Transactions on  (Volume:55 ,  Issue: 6 )