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Evaluation of Radiation-Hardened Design Techniques Using Frequency Domain Analysis

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4 Author(s)
Brian D. Olson ; Inst. for Space & Defense Electron., Vanderbilt Univ., Nashville, TN ; W. Timothy Holman ; Lloyd W. Massengill ; Bharat L. Bhuva

Frequency domain analysis is shown to be useful for quantifying the single-event vulnerability of a mixed-signal circuit. Frequency domain single-event analysis is demonstrated for different pipelined analog-to-digital converter topologies. Design tradeoffs of comparator redundancy are evaluated using a signal-to-noise ratio metric.

Published in:

IEEE Transactions on Nuclear Science  (Volume:55 ,  Issue: 6 )