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Evaluation of Radiation-Hardened Design Techniques Using Frequency Domain Analysis

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4 Author(s)
Olson, B.D. ; Inst. for Space & Defense Electron., Vanderbilt Univ., Nashville, TN ; Holman, W.T. ; Massengill, L.W. ; Bhuva, B.L.

Frequency domain analysis is shown to be useful for quantifying the single-event vulnerability of a mixed-signal circuit. Frequency domain single-event analysis is demonstrated for different pipelined analog-to-digital converter topologies. Design tradeoffs of comparator redundancy are evaluated using a signal-to-noise ratio metric.

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Nuclear Science, IEEE Transactions on  (Volume:55 ,  Issue: 6 )