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Estimation of surface snow properties using combined near-infrared reflectance and millimeter-wave backscatter

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3 Author(s)
Narayanan, R.M. ; Dept. of Electr. Eng., Nebraska Univ., Lincoln, NE, USA ; Jackson, S.R. ; St.Germain, K.M.

The need to estimate surface snow properties such as surface roughness, free-water content, and average grain size is crucial in determining the metamorphic state of snow for various military and environmental applications. Remote sensing techniques using combined concurrent measurements of near-infrared passive reflectance and millimeter-wave radar backscatter show promise in estimating the above snow parameters. Near-infrared reflectance is strongly dependent on snow grain size and free-water content, while millimeter-wave radar backscatter is primarily dependent on free-water content, and to some extent, on surface roughness. However, the spatial resolutions and penetration depths are different at near-infrared and millimeter wavelengths. By combining near-infrared and millimeter-wave measurements, the estimation of spatial variations in free-water content of snow can be improved considerably, while simultaneously providing meaningful estimates of grain size and surface roughness

Published in:

Combined Optical-Microwave Earth and Atmosphere Sensing, 1995. Conference Proceedings., Second Topical Symposium on

Date of Conference:

3-6 Apr 1995