Cart (Loading....) | Create Account
Close category search window

Raman scattering and photoluminescence studies on Cu2O

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Solache-Carranco, H. ; Dept. de Ing. Electr., CINVESTAV-IPN, Mexico City ; Juarez-Diaz, G. ; Galvan-Arellano, M. ; Martinez-Juarez, J.
more authors

Cuprous oxide (Cu2O) crystals were grown by the two step crystallization method in air atmosphere conditions from polycrystalline copper plates. The method comprises two stages; in the first one the copper plates are oxidized at 1020degC by some hours in line with its initial thickness. In the second stage the growth of large crystalline areas is promoted by annealing the Cu2O samples at 1100degC for long periods. The effects on the crystalline structure and photoluminescence (PL) response were studied as a function of the conditions used in the second stage of the synthesis method. Raman scattering and X-ray measurements demonstrates the existence of the single phase Cu2O. PL spectra were taken from 10 to 180 K to define the main radiative recombination paths. Besides of the near band excitonic transitions, two strong emission bands at 720 and 920 nm associated with relaxed excitons at oxygen and copper vacancies were detected. Both excitonic-vacancy bond transitions presented similar intensities which can be associated with the preparation method. The PL and the Raman scattering measurements were used to assess the evolution of the crystalline quality.

Published in:

Electrical Engineering, Computing Science and Automatic Control, 2008. CCE 2008. 5th International Conference on

Date of Conference:

12-14 Nov. 2008

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.