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Improved Optoelectronic Technique for the Time-Domain Characterization of Sampling Oscilloscopes

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4 Author(s)
Bieler, M. ; Phys.-Tech. Bundesanstalt, Braunschweig ; Spitzer, M. ; Pierz, K. ; Siegner, U.

We report on the enhancement of the Physikalisch-Technische Bundesanstalt's (PTB's) ultrafast optoelectronic measurement facility by characterizing the full impulse and step response of a 70-GHz sampling oscilloscope. A novel optoelectronic technique for the generation and the detection of ultrashort voltage pulses, which serve as calibration signals for the oscilloscope, is introduced. The uncertainty of the oscilloscope's time-domain response is derived from a Monte Carlo analysis. Aside from a more complete characterization, our enhanced technique considerably reduces the uncertainty of rise-time measurements.

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Instrumentation and Measurement, IEEE Transactions on  (Volume:58 ,  Issue: 4 )