By Topic

Attack Grammar: A New Approach to Modeling and Analyzing Network Attack Sequences

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Yinqian Zhang ; Sch. of Inf. Security Eng., Shanghai Jiao Tong Univ., Shanghai ; Xun Fan ; Yijun Wang ; Zhi Xue

Attack graphs have been used to show multiple attack paths in large scale networks. They have been proved to be useful utilities for network hardening and penetration testing. However, the basic concept of using graphs to represent attack paths has limitations. In this paper, we propose a new approach, the attack grammar, to model and analyze network attack sequences. Attack grammars are superior in the following areas: First, attack grammars express the interdependency of vulnerabilities better than attack graphs. They are especially suitable for the IDS alerts correlation. Second, the attack grammar can serve as a compact representation of attack graphs and can be converted to the latter easily. Third, the attack grammar is a context-free grammar. Its logical formality makes it better comprehended and more easily analyzed. Finally, the algorithmic complexity of our attack grammar approach is quartic with respect to the number of host clusters, and analyses based on the attack grammar have a run time linear to the length of the grammar, which is quadratic to the number of host clusters.

Published in:

Computer Security Applications Conference, 2008. ACSAC 2008. Annual

Date of Conference:

8-12 Dec. 2008