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Level crossing rate and average fade duration of the double Nakagami-m random process and application in MIMO keyhole fading channels

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3 Author(s)
Zlatanov, N. ; Fac. of Electr. Eng. & Informaion Technol., Ss. Cyril & Methodius Univ., Skopje ; Hadzi-Velkov, Z. ; Karagiannidis, G.K.

We present novel exact expressions and accurate closed-form approximations for the level crossing rate (LCR) and the average fade duration (AFD) of the double Nakagami-m random process. These results are used to study the second order statistics of multiple input multiple output (MIMO) keyhole fading channels with space-time block coding. Numerical and computer simulation examples validate the accuracy of the presented mathematical analysis and show the tightness of the proposed approximations.

Published in:

Communications Letters, IEEE  (Volume:12 ,  Issue: 11 )