Cart (Loading....) | Create Account
Close category search window
 

Influence of Negative Field on Media Noise in Combinations of Capped Medium and Shielded Pole Heads

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Ichihara, T. ; Central Res. Lab., Hitachi Ltd., Odawara ; Kashiwase, H. ; Nakagawa, Hiroyuki ; Nemoto, Hiroaki
more authors

In this study, a new mechanism responsible for the increase in media noise in perpendicular magnetic recording is discussed. We observed that the media noise of a particular linear density drastically increased for some combinations of shielded pole heads and capped media with higher Ms of cap layers and thinner SUL. A MFM observation indicated that the transition jitter increased at a linear density, which correlated with the domain width in the AC-erased region. It was assumed that the reconstruction of the magnetic domains due to the negative field around the trailing shield occurred when the transition period was comparable to the magnetic cluster size. These results indicated that the optimization of the field at the edge of the trailing shield and that of the magnetic characteristics for the cap layer were important for improving the overall R/W performance.

Published in:

Magnetics, IEEE Transactions on  (Volume:44 ,  Issue: 11 )

Date of Publication:

Nov. 2008

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.