By Topic

Surface Flaws Detection Using AC Magnetic Field Sensing by a Thin Film Inductive Microsensor

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Yu-Jung Cha ; Dept. of Phys., Yeungnam Univ., Gyeongsan ; Ki Hyeon Kim ; Jong-Sik Shon ; Young Ho Kim
more authors

Alternating magnetic field was used for detection of surface flaws on conductive metallic specimens. The nondestructive sensor probe was composed of the planar coil with inductive magnetic thin film yoke as a sensing component and a single straight typed exciting coil. The planar inductive coil sensor with magnetic yoke was fabricated by sputtering, electroplating, dry etching, and photolithography process. The exciting coil was generated by the alternative current with the range of 0.1-1.2 A with frequency rage of 0.6-1.8 MHz, respectively, which alternating current (ac) magnetic fields by exciting coil were applied to the specimen with artificial flaws. The specimens were prepared with the slit shaped artificial surface flaws (minimum depth and width; 0.5 mm) on metallic plate (Al; nonmagnetic metal and FeC; magnetic metal). The detected signal for the positions and shapes of surface flaws on specimens were obtained with high sensitivity and high signal to ratio by the planar inductive microsensor probe. The measured output signals by the noncontacted scanning on surface of coins (one cent and two euros) were converted to the images of the flaws. These results were compared with the optical images of real coins, respectively.

Published in:

IEEE Transactions on Magnetics  (Volume:44 ,  Issue: 11 )