Cart (Loading....) | Create Account
Close category search window
 

X-Ray Spectroscopic Investigations of Zn _{0.94} Co _{0.06} O Thin Films

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Mayer, G. ; Fachbereich Phys., Univ. Konstanz, Konstanz ; Fonin, Mikhail ; Voss, S. ; Rudiger, U.
more authors

We investigated Zn0.94 Co0.06 O thin films on sapphire (0001) substrates with respect to their structural and magnetic properties. X-ray diffraction shows a c axis oriented growth and no secondary phases within its resolution. A clear improvement of the crystalline quality was obtained by post annealing under vacuum conditions. Further information about the local electronic structure is obtained by X-ray absorption spectroscopy at the Co L 2,3 and the O K edge. Magnetic properties were investigated with a superconducting quantum interference device (SQUID) and by X-ray magnetic circular dichroism at the Co L 2,3 edge. Both techniques yield mainly paramagnetic behavior of the samples. For low temperatures, an additional small ferromagnetic contribution was observed in SQUID measurements. Several possible origins of this ferromagnetic contribution are discussed.

Published in:

Magnetics, IEEE Transactions on  (Volume:44 ,  Issue: 11 )

Date of Publication:

Nov. 2008

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.