By Topic

Transient signal detection using high-resolution line detection on wavelet transforms

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Aghajan, H. ; Inf. Syst. Lab., Stanford Univ., CA, USA ; Pati, Y. ; Kailath, T.

We associate the problem of estimating the locations of signal transients with the image processing task of detecting and estimating lines and axes of symmetry in an image obtained through the wavelet transform of the signal. We investigate the application of the SLIDE algorithm, an efficient high-resolution algorithm for line detection and estimation, to the image processing task associated with the detection of transient signals

Published in:

Signals, Systems and Computers, 1994. 1994 Conference Record of the Twenty-Eighth Asilomar Conference on  (Volume:2 )

Date of Conference:

31 Oct-2 Nov 1994