Cart (Loading....) | Create Account
Close category search window
 

Computationally efficient mutual information estimation for non-rigid image registration

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Gholipour, A. ; Dept. of Electr. Eng., Univ. of Texas at Dallas, Richardson, TX ; Kehtarnavaz, N.

The accuracy and computational complexity of mutual information (MI) estimation are critical factors in multi-modality non-rigid image registration. This paper discusses the accuracy and complexity of MI estimation approaches based on non-rigid registration functions. General formulations have been derived for Shannon's and Renyi's definitions of MI, as well as Cauchy- Schwartz quadratic MI. The results obtained indicate that a fuzzy histogram binning estimation approach is significantly faster and more accurate than the conventional non-parametric Parzen window estimation approach. The analytical formulations obtained for various MI definitions are continuously differentiable and are shown to be computationally efficient for high-dimensional optimization problems particularly for non-rigid image registration.

Published in:

Image Processing, 2008. ICIP 2008. 15th IEEE International Conference on

Date of Conference:

12-15 Oct. 2008

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.