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On Reusing Test Access Mechanisms for Debug Data Transfer in SoC Post-Silicon Validation

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2 Author(s)
Xiao Liu ; Dept. of Comput. Sci. & Eng., Chinese Univ. of Hong Kong, Shatin ; Qiang Xu

One of the main difficulties in post-silicon validation is the limited debug access bandwidth to internal signals. At the same time, SoC devices often contain dedicated bus-based test access mechanisms (TAMs) that are used to transfer test data between external testers and embedded cores. In this paper, we propose to reuse these precious TAM resources for real-time debug data transfer in post-silicon validation. This strategy significantly increases debug bandwidth with negligible routing overhead. To support different TAM architectures and debug scenarios, design for debug (DfD) structures are introduced at both core test wrapper level and system level. Simulation results demonstrate the effectiveness of the proposed approach at low DfD cost.

Published in:

Asian Test Symposium, 2008. ATS '08. 17th

Date of Conference:

24-27 Nov. 2008

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