Scheduled System Maintenance on May 29th, 2015:
IEEE Xplore will be upgraded between 11:00 AM and 10:00 PM EDT. During this time there may be intermittent impact on performance. We apologize for any inconvenience.
By Topic

Microstructural, Magnetic and Microwave Properties of Large Area BaFe _{12} O _{19} Thick Films ( >!100 \mu m) Deposited on /a-SiO _{2} /Si and /a-Al _{2} O _{3} /Si Substrates

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

7 Author(s)
Chen, Yajie ; Dept. of Electr. & Comput. Eng., Northeastern Univ., Boston, MA ; Smith, I.C. ; Geiler, Anton L. ; Vittoria, Carmine
more authors

We have demonstrated the feasibility of thick BaFe12O19 ceramic films fabricated on silicon (100) substrates. We obtained large area (1-in diameter) thick films (100-200 mum) by using a screen printing technique and amorphous SiO2 or Al2O3 buffer layers. To characterize the microstructural, magnetic, and microwave properties of ferrite films, we employed X-ray diffractometry, scanning electron microscopy, energy dispersive X-ray spectroscopy, dc magnetometry, and ferromagnetic resonance (FMR). We placed our emphasis on investigating silicon diffusion in terms of a depth analysis of composition for different buffer layers. We present and discuss FMR measurements for two polycrystalline samples with different buffer layers. We find that a-Al2O3 is superior to a-SiO2 as a buffer layer in achieving a tradeoff between magnetic and mechanical properties.

Published in:

Magnetics, IEEE Transactions on  (Volume:44 ,  Issue: 12 )