By Topic

Charging in Dielectricless Capacitive RF-MEMS Switches

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Mardivirin, D. ; XLIM Lab., Univ. de Limoges, Limoges ; Pothier, A. ; Crunteanu, A. ; Vialle, B.
more authors

This paper presents results on high lifetime RF microelectromechanical (RF-MEMS) dielectricless capacitive switches. Using air gap variation only, these RF MEMS capacitive switches achieve a capacitance ratio of 9, associated with small residual charging. The reliability of the switch has been studied, pull-in and pull-out voltages shifts have been observed, modeled and validated with good agreement between model and measurements for a switch held for one month in the down state. The dependence of charging mechanism to the biasing signal is also presented by applying unipolar and bipolar waveforms with different duty cycles. Charging can be modeled using a simple Curie-Von Schweidler equation. It is shown that the duty cycle of the bias signal is strongly accelerating switch failure, and that using bipolar signals improves the lifetime of these switches by several orders of magnitude. The projected lifetime of current RF-MEMS dielectricless switches held in the down state using bipolar signals is several tens of years.

Published in:

Microwave Theory and Techniques, IEEE Transactions on  (Volume:57 ,  Issue: 1 )