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In this paper, we introduce a simple and wideband characterization method for electric field probes using a transfer standard. As a transfer standard, a thin disk-type reference probe that can operate from 50 to 1000 MHz is used and calibrated using a micro transverse electromagnetic (mu-TEM) cell. A gigahertz transverse electromagnetic (GTEM) cell is used to generate a reference electric field. It has been shown that the uncertainty of the proposed method can be increased due to the imperfection of the field condition in the cell. According to the measurement result, the proposed characterization method for the electric probes agrees within 6.3%, compared with the method that uses the TEM cell and standard antennas in a fully anechoic chamber.