Cart (Loading....) | Create Account
Close category search window
 

Fast Analysis of Terahertz Integrated Lens Antennas Employing the Spectral Domain Ray Tracing Method

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Hailu, D.M. ; Electr. & Comput. Eng. Dept., Univ. of Waterloo, Waterloo, ON ; Ehtezazi, I.A. ; Safavi-Naeini, Safieddin

We present a computationally efficient spectral ray tracing (SRT) method that requires one spectral domain integration step for each observation point. We compare the SRT method with the finite element method (FEM) and geometrical optics (GO) via simulation of terahertz Gaussian beam propagation through a hemispherical lens. The SRT was able to accurately solve the problem 30 times faster than FEM. The matrix formulation of SRT is promising for solving complex electrically large problems with high accuracy and 2 orders of magnitude reduction in computation time through parallel processing.

Published in:

Antennas and Wireless Propagation Letters, IEEE  (Volume:8 )

Date of Publication:

2009

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.