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Economics modelling for the determination of test strategies for complex VLSI boards

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5 Author(s)
Dislis, C. ; Dept. of Electr. Eng. & Electron., Brunel Univ., Uxbridge, UK ; Dick, J.H. ; Dear, I.D. ; Azu, I.N.
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This paper describes the economics modeling techniques developed by the authors for the determination of optimal test strategies for board level testing. A number of interconnected economics models are used to describe the test process and the quality achieved, enabling the user to make predictive calculations for the effects of design and test choices. The results of sample runs presented, which illustrate the potential of the system as a decision making tool

Published in:
Test Conference, 1993. Proceedings., International

Date of Conference: 17-21 Oct 1993

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