By Topic

Accumulator-based BIST approach for stuck-open and delay fault testing

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Voyiatzis, I. ; Inst. of Inf. & Telecommun., NCSR Demokritos, Athens, Greece ; Paschalis, A. ; Nikolos, D. ; Halatsis, C.

In this paper a novel accumulator-based Built-In Self Test (BIST) method for complete two-pattern test generation is presented. Complete two-pattern testing has been proposed for stuck-open and delay testing. The proposed scheme is very attractive for a wide range of circuits based on data-path architectures with arithmetic units, or with accumulators containing binary adders. Our method generates all 2n (2n-1) distinct two-pattern pairs for a n-input circuit under test within 2n(2n-1) clock cycles. The proposed method can be easily modified to generate complete two-pattern tests for circuits having k, (k<n) inputs, within 2k(2k-1) clock cycles. Thus, this method is well-suited for circuits consisting of several modules with different number of inputs

Published in:

European Design and Test Conference, 1995. ED&TC 1995, Proceedings.

Date of Conference:

6-9 Mar 1995