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IEEE P1581 drastically simplifies connectivity test for memory devices

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1 Author(s)
Ehrenberg, H. ; GOEPEL Electron., Austin, TX

This poster provides an overview of IEEE P1581, for those not familiar with this standardization effort, and gives a status update of the IEEE P1581 specification development. We will also provide examples for the implementation of IEEE P1581 capabilities in SRAM, DRAM, and FLASH devices.

Published in:

Test Conference, 2008. ITC 2008. IEEE International

Date of Conference:

28-30 Oct. 2008