Scheduled System Maintenance:
On May 6th, single article purchases and IEEE account management will be unavailable from 8:00 AM - 12:00 PM ET (12:00 - 16:00 UTC). We apologize for the inconvenience.
By Topic

Overview of IEEE P1450.6.2 Standard; Creating CTL Model For Memory Test and Repair

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)

A new standard, P1450.6.2 is being developed to provide the syntax and semantics to support the memory test and repair requirements. The poster provides an introduction to the proposed standard. The syntax of the main CTL blocks is presented to demonstrate the effectiveness in addressing complicated memory testing requirements. An elaborate example is used to highlight the advantages of the memory CTL model.

Published in:

Test Conference, 2008. ITC 2008. IEEE International

Date of Conference:

28-30 Oct. 2008