Referenced Items are not available for this document.
How can we justify system level DFT? We must show that it has a positive return on investment (ROI). Existing test ROI models are manufacturing centric, do not account for the disaggregation of the product realization process, and are often focused on a specific DFT method. We propose a new, top-down, hierarchical ROI model, which starts with potential benefits and can handle entire systems more effectively than current models.
Published in:
Test Conference, 2008. ITC 2008. IEEE International
Date of Conference: 28-30 Oct. 2008
- Page(s):
- 1 - 10
- ISSN :
- 1089-3539
- E-ISBN :
- 978-1-4244-2403-0
- Print ISBN:
- 978-1-4244-2402-3
- INSPEC Accession Number:
- 10412796
- Conference Location :
- Santa Clara, CA
- Digital Object Identifier :
- 10.1109/TEST.2008.4700656
- Product Type:
- Conference Publications
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