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Linearity Test Time Reduction for Analog-to-Digital Converters Using the Kalman Filter with Experimental Parameter Estimation

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1 Author(s)
Le Jin ; Nat. Semicond., Santa Clara, CA

This work develops appropriate system and noise models, and a corresponding form of the Kalman filter to improve linearity test accuracy for high-resolution ADCs, while all necessary parameters are obtained from experimental measurements. The proposed algorithm can achieve comparable accuracy as that of the conventional histogram algorithm, by using a much smaller number of samples. This method can significantly shorten the test time and lower the cost of ADC production.

Published in:

Test Conference, 2008. ITC 2008. IEEE International

Date of Conference:

28-30 Oct. 2008