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Implicit Identification of Non-Robustly Unsensitizable Paths using Bounded Delay Model

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3 Author(s)
Jayaraman, D. ; Dept. of Electr. & Comput. Eng., Southern Illinois Univ., Carbondale, IL ; Flanigan, E. ; Tragoudas, S.

This paper presents a novel approach for identifying non-robustly unsensitizable paths using the bounded delay model for gate delays. A unique feature is that the unsensitizable paths are identified by working on a data structure that stores selected circuit paths instead of the netlist. It is shown that unless the delay of untestable paths are ignored, many non-robust paths will remain undetected. Experimental results show the approach implicitly identifies a large number of non-robustly unsensitizable paths, which were not identified with other existing techniques.

Published in:

Test Conference, 2008. ITC 2008. IEEE International

Date of Conference:

28-30 Oct. 2008