IEEE.org| IEEE Xplore Digital Library| IEEE Standards| IEEE Spectrum| More Sites

Cart (Loading....) | Create Account | 

Close category search window
Author Searchbeta |  Advanced Search  |  Preferences |  Search Tips  |  More Search Options  
 
Browse Conference Publications > Automation Congress, 2008. WA ... Help

Measurement and calculation of the transient electromagnetic disturbances of secondary system in HVDC converter station

Full Text Sign-In or Purchase

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing! close button
puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Lei Liu ; Sch. of Electr. & Electron. Eng., North China Electr. Power Univ., Baoding ; Xiang Cui ; Qi Wang ; Haifeng Sun

Many new technologies especially micro electronic components have been widely used in the secondary system of the HVDC converter stations. When switch operated there would be kinds of actuating of relay in secondary system. The action of relay tip will generated electromagnetic disturbance (EMD) which will transmit to the protect devices along the secondary cables. The results of an experimental study on the EMD of secondary system in HVDC converter station are presented in this paper. The model of secondary cable and calculation of EMD are also presented. Based on the experimental and calculation results, the characteristics of EMI in secondary system are analyzed. The results of this paper has certain reference value for the device of the anti EMD of the secondary system.

Published in:
Automation Congress, 2008. WAC 2008. World

Date of Conference: Sept. 28 2008-Oct. 2 2008

Page(s):
1 - 4
E-ISBN :
978-1-889335-37-7
Print ISBN:
978-1-889335-38-4
INSPEC Accession Number:
10411950
Conference Location :
Hawaii, HI
Product Type:
Conference Publications

IEEE Account

Purchase Details

Profile Information

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.