Close category search window
 

Feature extraction using an AM-FM model for gait pattern classification

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Ning Wang ; Sch. of Electr. Eng. & Telecommun., Univ. of New South Wales, Sydney, NSW ; Ambikairajah, E. ; Celler, B.G. ; Lovell, N.H.

This paper describes classification of gait patterns from a waist-mounted triaxial accelerometer. A feature extraction technique using empirical mode decomposition (EMD) and an amplitude/frequency modulation (AM-FM) model is proposed for the classification of walking activities from accelerometry data. A set of novel features, including AM, instantaneous frequency (IF) and instantaneous amplitude (IA), representing the walking patterns were obtained based on a second-order all-pole resonator. The back-end of the system was a 32-mixture Gaussian Mixture Model (GMM) classifier. An overall classification error rate of 4.88% was achieved for the five different human gait patterns referring to walking on flat levels, walking up and down paved ramps and walking up and down stairways.

Published in:
Biomedical Circuits and Systems Conference, 2008. BioCAS 2008. IEEE

Date of Conference: 20-22 Nov. 2008

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.