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A strongly code disjoint built-in current sensor for strongly fault-secure static CMOS realizations

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3 Author(s)
Lo, J.-C. ; Dept. of Electr. & Comput. Eng., Rhode Island Univ., Kingston, RI, USA ; Daly, J.C. ; Nicolaidis, M.

We present a strongly code disjoint (SCD) built-in current sensor (BICS) based on self-exercising concept. The integration of this SCD BICS with a self-checking circuit achieves the totally self-checking goal in static CMOS realizations, even in the presence of stuck-on and bridging faults, and results in a strongly fault-secure realization. Low-cost and high fault coverage is attractive for many high reliability and critical applications

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Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:14 ,  Issue: 11 )