By Topic

Some critical remarks on a hierarchy of fault-detecting abilities of test methods [and reply]

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
R. A. DeMillo ; Dipartimento di Elettronica e Inf., Padova Univ., Italy ; A. P. Mathur ; W. E. Wong ; P. G. Frankl
more authors

In a recent article by P.G. Frankl and E.J. Weyuker (see ibid., vol.19, no.3, p.962-75, 1993), results are reported that appear to establish a hierarchy of software test methods based on their respective abilities to detect faults. The methods used by Frankl and Weyuker to obtain this hierarchy constitute a new and important addition to their arsenal of tools. These tools were developed specifically to establish simple, useful comparisons of test data generation methods. This is the latest step in an ambitious test method classification program undertaken by the Frankl and Weyuker and their collaborators. The article discusses the method and goes on to present a reply to the critique.

Published in:

IEEE Transactions on Software Engineering  (Volume:21 ,  Issue: 10 )