Cart (Loading....) | Create Account
Close category search window
 

Improving Sequential Detection Performance Via Stochastic Resonance

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Hao Chen ; Dept. of Electr. Eng. & Comput. Sci., Syracuse Univ., Syracuse, NY ; Varshney, P.K. ; Michels, J.H.

In this letter, we present a novel instance of the stochastic resonance effect in sequential detection. For a general binary hypotheses sequential detection problem, the detection performance is evaluated in terms of the expected sample size under both hypotheses. Improvability conditions are established for an injected noise to reduce at least one of the expected sample sizes for a sequential detection system using stochastic resonance. The optimal noise is also determined under such criteria. An illustrative example is presented where performance comparisons are made between the original detector and different noise modified detectors.

Published in:

Signal Processing Letters, IEEE  (Volume:15 )

Date of Publication:

2008

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.