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Strong fault-secure and strongly self-checking domino-CMOS implementations of totally self-checking circuits

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1 Author(s)
Jha, N.K. ; Dept. of Electr. Eng., Princeton Univ., NJ, USA

The totally self-checking (TSC) concept is well established for applications in the area of online error-indication. TSC circuits can detect both transient and permanent faults. They consist of a functional circuit with encoded inputs and outputs and a checker which monitors these outputs. The TSC concept can be generalized for the functional circuits using the strongly fault-secure (SFS) concept. Here, the concept of strongly self-checking (SSC) circuits, which is a generalization from TSC circuits, is introduced. Most of the TSC circuits presented in the literature are designed at the logic gate level using the stuck-at fault model. However, this fault model is inadequate for MOS technologies. Here, it is shown that a TSC gate-level functional circuit can be implemented in the domino-CMOS technology as an SFS circuit, while a TSC gate-level checker can be implemented as an SSC checker. For the domino-CMOS implementation the fault model is enlarged to stuck-at, stuck-open, and stuck-on faults. It is shown that domino-CMOS is much more suitable for implementation of self-checking circuits than static CMOS

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Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:9 ,  Issue: 3 )