Referenced Items are not available for this document.
A sequence of input vectors which detects all transistor stuck-open faults in a CMOS combinational circuit is a complete test sequence. Given a complete set of two-pattern tests for transistor stuck-open faults in a CMOS circuit, it is shown that a complete test sequence of minimum length can be obtained efficiently. A precise description of this problem and examples to illustrate the method are presented
Published in:
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
(Volume:9
,
Issue:
3
)
Date of Publication: Mar 1990
- Page(s):
- 329 - 331
- ISSN :
- 0278-0070
- INSPEC Accession Number:
- 3638929
- Digital Object Identifier :
- 10.1109/43.46808
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 06 August 2002
- Issue Date :
- Mar 1990
- Sponsored by :
- IEEE Council on Electronic Design Automation
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