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Computing optimal test sequences from complete test sets for stuck-open faults in CMOS circuits

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2 Author(s)
Chakravarty, S. ; Dept. of Comput. Sci., State Univ. of New York, Buffalo, NY, USA ; Ravi, S.S.

A sequence of input vectors which detects all transistor stuck-open faults in a CMOS combinational circuit is a complete test sequence. Given a complete set of two-pattern tests for transistor stuck-open faults in a CMOS circuit, it is shown that a complete test sequence of minimum length can be obtained efficiently. A precise description of this problem and examples to illustrate the method are presented

Published in:

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:9 ,  Issue: 3 )

Date of Publication:

Mar 1990

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