Cart (Loading....) | Create Account
Close category search window

An Integrated Model between Knowledge Management Processes and Product Development Processes

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Qian-Wang Deng ; Coll. of Mech. & Automotive Eng., Hunan Univ., Changsha ; Yong-Zheng Tian

A product development process is complex as well as knowledge-intensive. An approach of integrating knowledge management process models into product development process models is proposed. In the approach, a method named knowledge-based engineering process model is adopted as the method of modeling a product development process. To realize the integration between knowledge management process model s and the product development process models, a basic rule, considering the knowledge management process as a special kind of sub-process in product development processes, is followed. Finally, an integrated model of knowledge management process models and product development process models is presented.

Published in:

Wireless Communications, Networking and Mobile Computing, 2008. WiCOM '08. 4th International Conference on

Date of Conference:

12-14 Oct. 2008

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.